Hd Conductive & Electrostatic Studies

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Description

Electrical characterization of objects, that are weakly attached to the surface, has always been a challenge when using standard AFM modes like Conductive AFM. This was because often the tip moved or abraded the objects of interest. HybriD Mode drastically decreased the impact of lateral forces and simplified these experiments. Comparison of conductive and mechanical maps shown in this example allows the clear identification of single nanotubes and bundles. New stateoftheart HybriD 2.0 control electronics allows simultaneous resonant electrostatic studies using twopass technique Kelvin Probe Force Microscopy Electrostatic Force Microscopy Scanning Capacitance Force Microscopy

  • Optical measuring equipment
  • Force Microscopy
  • Scanning Microscopy
  • Qnm Measurements

Domain icon Manufacturer/ Producer

124460 Moscow - Russia

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