Optical profilometer for contactless 3D surface metrology. Combines confocal metrology in HD with interferometry to a versatile dual core system. High-performance software, simple module selection with one click and confocal scanning without movable parts help to make the analysis very efficient and fast. HD confocal measurement with vertical resolution up to 2nm for surfaces with sloping areas and intricate structures. Interferometry with a resolution up to 0,1 mm for even surfaces with microstructures. Fast, reproducible data capture due to innovative HD microdisplay scanning technology without any movable parts in the sensor head. The integrated HD CCD-Camera has an extra-large field of view, for the analysis of bigger areas. Realistic color imaging due to four varicolored LEDs in the sensor head.

Machine vision system

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