NT-MDT LLC - Developer of research instrumentation and scientific equipment

Highperformance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment Userfriendly change of wavelength of AFM registration system laser and photodiode Easy and userfriendly change of objectives Integration with IR sSNOM (optional) Since 1998 NTMDT has been successfully integrating AFM with optical microscopy and spectroscopy techniques. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in highfrequency (up to 5MHz) modes. This feature appears to be principal for the work with highfrequency AFM modes and using highfrequency cantilevers.* There are several scanning types implemented in NTEGRA scanning by the sample, scanning by the probe and dualscanning. On account of that, the system is ideal for investigating small samples with ultrahigh resolution (atomicmolecular level) as well as for big samples and scanning range up to 100x100x10 µm.

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus