SE0S 02 is the best solution for the customers, who need quick analysis, high specifications, safety and fair accuracy of element composition identification results in metal production at minimal purchase, commission and operating of the device costs. Applications: - Industrial analytical laboratories of metallurgical and machine-building factories; - Express analysis of alloys while melting at workshops; - Identification of alloy grade at warehouses; - Research institutes and universities. SEOS 02 identifies the composition of iron alloys (all types of steel and cast iron) and nonferrous alloys on any basis (Al, Cu, Zn, Ni, Ti, Mg, Co, Pb, etc.). CCD allows to analyze the whole range of basic elements used in metallurgy, including S, P, C. SEOS 02 measurement accuracy is in accordance with international regulatory documents. Every SEOS 02 spectrometer passes the state verification procedure as a measuring instrument.
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Knight Optical can offer you stock and custom lambda/10 mirrors for use in Spectromters, in a range of materials such as BK7 or equivalent, Zerodur, Quartz, UV Fused Silica and many more. Mirrors are made from low expansion glass for optimum stability to maintain the lambda/10 flatness. The mirrors help produce high quality signals and can be coated with a variety of coatings to ensure that the perfect quality image in the wavelength you require is achieved: •Enhanced aluminium 94%R for visible applications. •99.9% dielectric for laser use in visible applications. •UV aluminium for UV applications down to 180nm. •98.5% dielectric for laser use in the NIR applications. •Ion plated silver for NIR-2000nm applications. •Protected gold for 750nm to far infra-red applications Lambda/10 mirrors are used to produce a better quality signal from the mirror, resulting in a higher quality result for transmission. Read PDF for full spec
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The LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FT-IR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: • Extremely fast FT-IR imaging (FPA) • High spectral quality and resolution • Brilliant visual images and huge field of view • Fully automated FT-IR microscope • Integrated, piezo-controlled ATR crystal • Software supported measurement and evaluation • Automatic measurement in transmission, reflection and ATR
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These are the optical fiber fastener which accessories used in electronic. They were made by brass, optical fiber fasteners are essential components in the field of fiber optics. Optical fiber fasteners play a crucial role in managing and securing fiber optic cables. They are designed with specific features to ensure the safety and integrity of the cables, making them an indispensable tool in the field of fiber optics.
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Many materials cannot be measured tactilely, therefore non-contact thickness measurements become necessary. Especially e.g. with glowing materials, or wet processes, a continuous tactile measurement is nearly impossible. Furthermore, web speeds in plant engineering and production have increased, requiring a corresponding fast sampling rate of the measuring systems. In addition, high measuring widths are often required. Why is contact free measurement technology so perfect for this application? Can be used in any web width, Scalable measurement thicknesses from a few millimetres to several meters, Thickness and coating thickness can be measured for different materials, Vibrations of the web materials, can be compensated, Turnkey solution for mechanical engineering, Non-contact and non-destructive measurement method, Large distances to the measured object are possible, Measurement of free forms,
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