SiBrickScan (SBS)

Silicon Ingot Analyzer
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Description

SiBrickScan (SBS) is a dedicated at-line system for the FTIR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage. Get Valuable Information to Check and Optimize Product Quality Knowing the Oxygen gradient of Si ingots enables important conclusions helping e.g. to control and optimize the Silicon crystallization process or to identify batches of bad raw material. Therefore SBS will help to save costs by optimizing product quality and reducing the amount of defective wafers. The random sampling of individual ingots does strongly reduce sample preparation efforts and provides relevant information much earlier.

  • Laboratory equipment and instruments
  • spectrometers
  • spectrometry

Domain icon Manufacturer/ Producer

76275 Ettlingen - Germany

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