Software for 3D & 2D surface profilometers

Dedicated surface imaging, analysis and metrology software for 3D optical microscopes and profilers measuring topography - confocal microscopes, interferometric microscopes, digital holographic microscopes, focus variation microscopes & structured light systems Compatible with all 3D optical profilers and microscopes used for surface analysis and metrology. Real time imaging of 3D surface topography with near-perfect lighting. 3D surface overlays for fast feature location - overlay color and intensity images on 3D topography. Remove data acquisition artifacts - outliers, local defects. Increase field of view virtually - assemble measurements using surface topography stitching. Analyze roughness and surface texture - in accordance with the latest ISO and national standards. Analyze surface geometry - including volume of surface structures (bumps, holes), step heights. Extract and analyze regions of interest - study them in the same way as full measured surfaces. 3D reconstruction of multi-focus images - reconstruct 3D topography from multi-focus image stacks. Easy integration into lab and production environments - export of all numerical results. Easy publication - export analysis documents, pages and individual images up to 1200 dpi. Add optional modules for advanced surface texture analysis, contour analysis, grains and particles analysis, 3D Fourier analysis, image co-localization, statistics and more.