Solver Nano

Specialized AFM

Description

AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, userfriendly and professional tool. Solver Nano is designed by the NTMDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications. Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software. These capabilities enable all of the basic AFM techniques in compact SPM design.

  • Optical measuring equipment
  • Ntegra Spectra
  • Routine Analytical
  • Afm Techniques

Product characteristics

Scanner
100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
AFM resolution
0.01 nm
Environments
Air and liquid measurements.
Combined video optical microscopes
Build in 100x optical USB microscope
Design
Table-top, affordable, robust and user-friendly
High voltage regime
100x100x12 um
Low voltage regime
3x3x3 um
Scanner type
Metrological piezotube XYZ scanner with sensors
Sensors type
XYZ – ultrafast capacitance sensors
Low noise XY sensor
<0.3 nm
Metrological Z sensor
<0.03 nm
Metrological XY sensor
<0.1%
Sensors linearity Metrological Z sensor
<0.1%
Resolution
XY - 0.3 nm, Z - 0.03 nm
Linearity
XY - <0.1%, Z - <0.1%
Sample positioning range
12 mm
Sample positioning resolution
1.5 um
Sample dimension
up to 1,5” X 1,5” X 1/2”, 35x35x12 mm
Sample weight
Z – Stepper Motor
Approach system step size
230 nm
Approach system speed rate
10 mm per min
Algorithm Gentle approach
Available (probe guaranteed to stop before it touches the sample)
AFM head for Si cantilever
Available. All commercial cantilevers can be used
Type of cantilever detection
Laser/Detector Alignment
Probe holders
Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting
Cinematically mount. Mount accuracy 150 nm (Remove/mount accuracy)
STM AFM head for wire probes
Available. Tungsten wire for AFM measurement. (low cost experiments)
Number of images can be acquired during one scanning cycle
Up to 16
Image size
Up to 8Kx8K scan size
DSP
Floating point 320 MHz DSP
Digital FB
Yes 6 Channels
DACs
4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage 2 16-bit DAC for user output
High-voltage outputs
X, -X, Y, -Y, Z, -Z at -150 V to +150 V
XY RMS noise in 1000 Hz bandwidth
0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth
0.3 ppm RMS
XY bandwidth
4 kHz (LV regime – 10 kHz)
Z bandwidth
9 kHz
Maximal current of XY amplifiers
1.5 mA
Maximal current of Z amplifiers
8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors
Yes
Open/Closed-loop mode for X,Y controlх
Yes
Generator frequency setting range
DC – 5 MHz
Deflection registration channel bandwidth
170 Hz - 5 MHz
Lateral Force registration channel bandwidth
170 Hz - 5 MHz
2 additional registration channel bandwidth
170 Hz - 5 MHz
Bias Voltage
± 10 V bandwidth 0 – 5 MHz
Number of generators for modulation, user accessible
2, 0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs
Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs
6
Additional digital outputs
1
I2C bus
Yes
Max. cable length between the controller and SPM base or measuring heads
2 m
Computer interface
USB 2.0
Voltage supply
110/220 V
Power consumption
≤ 110 W

Domain icon Manufacturer/ Producer

124460 Moscow - Russia

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