Draw-wire Sensors For Serial Integration & Oem

The confocal chromatic confocalDT measuring system is used for fast distance and thickness measurements. Different sensor models and controller interfaces open versatile fields of application, e.g., in the semiconductor industry, glass industry, medical engineering and plastics production.

The IMS5420 is a high-performance white light interferometer for non-contact thickness measurement of monocrystalline silicon wafers. The controller has a broadband superluminescent diode (SLED) with a wavelength range of 1,100 nm. This enables the thickness measurement of undoped, doped and highly doped SI wafers with only one measuring system. The IMS5420 achieves a signal stability of less than 1 nm. The thickness can be measured from a distance of 24 mm.

Draw-wire sensors of the wireSENSOR series measure almost linearly over the entire measuring range and are used for distance and position measurements between 50 mm and 50,000 mm. Draw-wire sensors from Micro-Epsilon are ideal for both direct integration and subsequent assembly in serial OEM applications, e.g., in medical devices, lifts, conveyors and automotive engineering.

Miniature MP and MT draw-wire sensors are designed for measurement tasks with fast wire movements. Their robust aluminum housing makes the sensors suitable for industrial applications. The MP and MT draw-wire sensors are equipped with a potentiometer.