MµProbe Probe Cards
for MEMS contact elements and fine pitch full array applications wafer test
Description
MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.
- Electrical & Electronic Components
- MEMS contact elements
- fine pitch full array applications
Similar products from FEINMETALL GMBH
FEINMETALL GMBH
Germany
Contacting of all common RF connectors: For frequencies up to 20 GHz, with smart design for highest reliability and easy mounting.
FEINMETALL GMBH
Germany
Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.
