Optical components - Import export

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.

Tip Enhanced Raman Scattering (TERS, nanoRaman) is the technique for enhancement of weak Raman signals and for superresolution Raman imaging with spatial resolution less than 10 nm. As a result of comprehensive research performed together with NTMDT SI customers and partners, we are now able to offer to AFMRaman customers mass produced reproducible TERS probes. TERS imaging requires prolonged tipsample contact at each scanning point but Contact AFM is destructive for both the tip and the sample. Thereby, HD mode is a superior technique for cantilevertype TERS since it noticably increases the tip lifetime and makes possible TERS imaging of soft, loose and fragile samples. Thanks to highspeed HybriD 2.0 Control Electronics the approach and withdrawal optical response signal curve (PMT) can be recorded and processed in realtime. This allows to separate the nearfield from farfield component of optical response and to map it with spatial resolution limited by the tip radius.