MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.
Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.
Contacting WLCSP, SiP or flipchip wafers requires probe cards that can tolerate high currents while ensuring high signal integrity. The FeinProbe® addresses these applications perfectly.
Feinmetall test connectors are available for many interfaces such as RJ, USB, HDMI and others. They can be installed very easily and effectively in test fixtures and test modules.
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71083 Herrenberg -