Ntegra Nano Ir

AFM-Raman-Nano-IR Systems

Description

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

  • Optical measuring equipment
  • Spectrum Instruments
  • Nano Spectroscopy
  • Optical Microscope

Product characteristics

Wide spectral range of operation
3-12 μm
Low noise LN2 cooled MCT detector
<30 nV/√Hz at tapping frequency harmonics (100 kHz – 1 MHz)
High-performance low noise AFM
Z-noise <0.05 nm (RMS in 10-1000 Hz bandwidth)
Stable AFM performance at high temperatures
up to 150 °C with standard heating stage
Focus track feature
sample always stays in focus due to sample Z-feedback

Documents

Domain icon Manufacturer/ Producer

124460 Moscow - Russia

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