Quantitative studies - Import export

AFMSICMRaman triple synergy of powerful nanocharacterization techniques Hopping mode ion conductance microscopy noncontact imaging of living cells and jelly surfaces QNM power of AFM and SICM quantitative nanomechanical studies Smart Patch Clamp automatic nanopipette targeting for ion channel studies HighSpeed LongRange HighResolution mapping at nanoscale Nanoinjection nanopipettes with SICM feedback control can be used for local subpicoliter injections to single cells SICM (Scanning Ion Conductance Microscopy) is an SPM technique which uses nanopipette (sharp glass electrode) for noncontact 3D surface mapping at high resolution. In SICM, the probe to sample distance is controlled via the decrease of ionic current flowing through the tip, as it approaches the sample surface. Biophys.Journ. 73, 653658

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.