Force measurement - Import export

NIOS Micro is a new device in the NIOS product line that is designed to perform Vickers microindentation in the scale range from HV 0.01 to HV 50. It is certified as a measuring instrument and can be used in scientific and industrial laboratories. The device implements algorithms for automatic application of indent arrays and measurement of indent boundaries, which allow performing various measurements depending on the tasks set, as well as determining the depths of surface hardening (SHD, Surface Hardering Depth), carburizing (CHD, Case Hardering Depth) and other characteristics. The design of NIOS Micro is built on the same modular principle as other NIOS hardness testers. If required, NIOS Micro can also be equipped with a nanoindentation module, maximizing the range of forces measured and applicable methods

NIOS series modular design allows end-users to configure nanomechanical tester specifically for their needs and requirements. Configurations of NIOS nanomechanical tester can consist of following modules: - Widerange nanoindenter - Optical Microscope - Atomic Force Microscope - Scanning nanomechanical tester - Electrical Properties Measurement - Lateral Force Sensor - Insitu Topography Imaging - Heating Stage NIOS Advanced is the flagship model that implements more than 30 different measuring techniques covering all types of physical and mechanical properties measurements at the submicron and nanometer scale. With NIOS control software high degree of automated measurements can be achieved allowing end-user to configure any set of measurement recipes to be performed without operator intervention. This feature is particularly useful for technical control of materials quality. With this added functionality, NIOS can be used for research and for industrial applications.

Thermoelectric studies of nanoscale structures like np junctions, conductive nanowires, graphene oxide etc. are currently of a great interest. HD Scanning Thermoelectric Microscopy (HD SThEM) allows nondestructive mapping of Seebeck coefficient with tip radiuslimited spatial resolution. HD SThEM working principle is based on direct measurement of generated voltage when conductive tip and sample under different temperatures contact each other during fast force spectroscopy measurements.

Operating a scanning probe microscope, where the tipsample force interactions are measured with high precision and at small scales, requires an environment that is free of the external perturbations caused by vibrational and acoustic noise. Just as important is the temperature stability of the microscope in order to ensure a low thermal drift of a sample during experiments. A unique feature of Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) is a relatively slow feedback mechanism in most of their modes. Therefore, a large number of experiments such as imaging at the atomicscale, profiling of corrugated surfaces, collecting of local force curves in the force volume operation, among others will benefit from lowthermal drift conditions. A stable position of the sample will also help to examine the same surface region with different AFM modes, making the surface analysis more comprehensive.

Force spectroscopy is a wellknown AFM technique for quantification of local nanomechanical properties. HD mode allows fast, more than 1000 force curves per second measurements, realtime calculation of Young’s modulus according to Hertz, DMT, JKR and other mathematical models and automated cantilever force constant calibration. HybriD Mode uniquely enables stiff materials to be distinguished from each other by means of an AFM probe. Areas corresponding to Bismuth (32 GPa, blue color) and Tin (50 GPa, yellow color) are clearly identified. The mechanical properties map corresponds well with the surface potential image.

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.