Metrology solutions - Import export

When specifying a 3D optical metrology solution, it is important to appreciate that not all tools are the same, and users should look for solutions characterized by their speed, superior measurement precision, magnification range, and the ability to measure a broad spectrum of surfaces from the super-smooth to the extremely rough. ZYGO's Coherence Scanning Interferometry (CSI) based 3D Optical Profilers deliver best in class performance in all of these categories. These systems use the principle of optical interference to measure a sample. Coherence Scanning Interferometry Diagram:as shown in the image, illumination is divided into two paths where one travels to a precision reference surface, and the other travels to the test surface. The reflections from these two surfaces combine at a camera detector where they interfere with each other, and a pattern of light and dark intensities is created ... Click to read more

Micro Lens Process Metrology Systems ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets. There are two models of Compass™ systems available, depending on your metrology needs... Compass – ZYGO's advanced solution for precision metrology of micro lens surface form and deviation, topography, and relational/dimensional parameters. This is the ideal choice for applications that require complete characterization of spherical or aspherical micro lenses and their alignment features. Compass RT Metrology SystemCompass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.